Department of Materials Science and Engineering
Michigan Technological University
Abstract: This talk presents an overview of state-of-the-art capabilities of the aberration-corrected scanning transmission electron microscope (ac-STEM) at ACMAL, Michigan Tech. The FEI Titan Themis microscope we have here is one of a kind in the whole nation in terms of capabilities.
Tuesday, October 22 at 11:00 am to 12:00 pm
Minerals and Materials Engineering Building (M&M), 610
1400 Townsend Drive, Houghton, MI 49931