Michigan Tech and the Materials Science and Engineering (MSE) department seek a postdoctoral scientist to serve as a specialist in the operation and application of an FEI Titan Themis Scanning Transmission Electron Microscope (STEM) and its associated attachments for interdisciplinary users across campus as well as potential users external to campus.
The EBSD detector on the ESEM has been damaged and the phosphor screen will need to be replaced. We are in contact with Oxford and hope to have the repairs completed in the next few weeks. The ESEM is still available for SE/BSE imaging and EDS analysis.
Please remember EBSD is only to be performed by highly-skilled, trained users who have been trained by ACMAL staff to use the EBSD detector. This is a very sensitive process and the detector can easily be damaged. Users with large SEM samples also need to be careful not to hit the detectors. Repairs are costly and result in instrument downtime.