Category: FEI 200k Titan Themis S-TEM

S-TEM in Electron Optics

Recent Advances in ACMAL STEM Facility on January 22

Pinaki Mukherjee
Pinaki Mukherjee

Join us for the first seminar of the Spring Semester at 1 p.m. Friday (Jan. 22) via Zoom (passcode 645507).

Pinaki Mukherjee (MSW) will present ” Recent Advances in ACMAL STEM Facility.” This talk presents an overview of state-of-the-art capabilities of the aberration-corrected scanning transmission electron microscope (ac-STEM) at ACMAL, Michigan Tech.

Mukherjee joined Michigan Tech in January of 2018. He obtained his PhD in Materials Engineering from the University of Nebraska-Lincoln. He worked as a post-doctorate researcher at Rutgers University, The State University of New Jersey. He was an affiliate of the National Center for Electron Microscopy, at Lawrence Berkley National Laboratory.


Free GMS 3 Update

This is the software that Pinaki uses for some of his STEM data. 

Extend your research from home

By popular demand, Gatan is extending the limited-time version of Gatan Microscopy Suite (GMS) 3.4.1 software to help the electron microscopy community continue with their research from home.

Similar to the EELS/EDS Quantification and EFTEM analysis plugins, the new version unlocks the DigitalMontage, HREM, and STEMx capabilities. This temporary version is available until June 1, 2020, at no additional cost. Please download the latest package to access these new features and for minor bug fixes.

Download GMS

If you have any questions or need more information, please don’t hesitate to reach out to us.

Best regards,
Gatan


All reservations cancelled

As a result of Dr. Koubek’s email to campus regarding the Governor’s executive order, I am cancelling all use reservations in the calendar this afternoon.  We will be ready to begin again after we return from the stay at home 3 weeks from now.


Analytical Electron Microscopy at Nanoscale Feb. 13

Pinaki Mukherjee
Pinaki Mukherjee

ME-EM Graduate Seminar Speaker Series

proudly presents:

Pinaki Mukherjee, PhD

Michigan Technological University

Abstract: This talk presents an overview of state-of-the-art capabilities of the aberration-corrected scanning transmission electron microscope (ac-STEM) at ACMAL, Michigan Tech. The FEI Titan Themis microscope we have here is one of a kind in the whole nation in terms of capabilities. These capabilities have been developed in last two years and most of them are already available for users. We have a wide range of imaging and spectroscopic techniques that enables a user to identify elements at atomic scale (~ 0.1 nm). READ MORE

Thursday, February 13 at 4:00 p.m.

Electrical Energy Resources Center (EERC), 103
1400 Townsend Drive, Houghton, MI 49931