Category Archives: Electron Optics Facility Featured

FESEM and FIB Used in Area-selective Atomic Layer Deposition Research

Surface Science cover for volume 690 December 2019.
Raman confocal images of Al2O3 make the cover of Surface Science.

Graduate students Mikhail Trought (Chemistry) and Chathura de Alwis (Chemistry), with undergraduate student alumnus Isobel Wentworth (ChemEng), research assistant professor Timothy R. Leftwich (MSE), and assistant professor Kathryn A. Perrine (Chemistry) published a paper titled “Influence of surface etching and oxidation on the morphological growth of Al2O3 by ALD” in Surface Science on August 9, 2019.

The authors acknowledge the Applied Chemical & Morphological Analysis Laboratory (ACMAL) at Michigan Technological University for use of instruments and staff assistance, including Director Owen Mills, for training on the FESEM and FIB.

M. Trought and K. Perrine prepared the samples at Michigan Tech and at the Univ. of Minnesota, performed the surface analysis, analyzed all data collected, and wrote the manuscript. T. Leftwich assisted with the XPS data collection and analysis, and reviewing & editing the manuscript. I. Wentworth and C. de Alwis assisted with sample preparation and FTIR analysis. K. Perrine conceptualized the project.

S-TEM Tomography Video

Screenshot of particles in a box with 500 nm scale bar
S-TEM Tomography of Li-ion Battery Cathode Particles

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Research by Stephen A. Hackney, Professor, Materials Science and Engineering, Michigan Technological University.

Imaging by Pinaki Mukherjee, Staff, Materials Science and Engineering, Engineer/Scientist, Applied Chemical and Morphological Analysis Laboratory (ACMAL).

Instrument: FEI 200kV Titan Themis S-TEM in ACMAL’s Electron Optics Facility.

Scale bar indicates 500 nm.

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Graphite exfoliation by supercritical carbon dioxide extraction

Wattanaprayoon Supercritical Carbon Dioxide
A schematic of graphite exfoliation by supercritical carbon dioxide.


Supercritical carbon dioxide is used to exfoliate graphite, producing a small, several-layer graphitic flake. The supercritical conditions of 2000, 2500, and 3000 psi and temperatures of 40°, 50°, and 60°C, have been used to study the effect of critical density on the sizes and zeta potentials of the treated flakes. Photon Correlation Spectroscopy (PCS), Brunauer-Emmett-Teller (BET) surface area measurement, field emission scanning electron microscopy (FE-SEM), and atomic force microscopy (AFM) are used to observe the features of the flakes.

Wattanaprayoon, Chaiyaporn, “Graphite exfoliation by supercritical carbon dioxide extraction”, Master’s Thesis, Michigan Technological University, 2011.