Student Team Shares Exciting Images

A materials science and engineering team of students Sonja Blickley, Tori Nizzi, Anna Palmcook, and Austin Schaub were sponsored by Hobart Brothers LLC. (Hobartbrothers.com) to develop a new process that has yielded some exciting results. Working with Dr. Erico Freitas, manager of the Electron Optics Facility, these students used the FEI 200kV Titan Themis Scanning Transmission Electron Microscope (STEM) to produce some awesome images of a welded material. They have granted special permission to show these pictures here, despite wishing to keep their work and the composition of their material confidential.

Micrograph with 500 nm scale showing dotted features on larger grains with boundaries.
Image 1 – This image shows a dispersed material within a matrix on the nanometer scale.
Micrograph on the 200 nm scale showing some of the dot features and the texture of the material.
Image 2 – This image is also a section of the first, zoomed in 70,000 times! To achieve this resolution the team used a High-Angle Annular Dark Field (HAADF) imaging technique.
Micrograph at the 10 nm of the dot feature, with a zoom showing its atomic structure.
Image 3 – This image is a section of the first, zoomed in 1,600,000 times! This was also taken using HAADF.

This team is very excited about their results, which help to drive the science of materials and engineering forward. Congratulations to them for their hard work paying off!

By Joshua Jongema.