Category: FEI 200k Titan Themis STEM

STEM in Electron Optics

Recent Advances in ACMAL STEM Facility October 22

Pinaki Mukherjee
Pinaki Mukherjee

Materials Science and Engineering Seminar

Dr. Pinaki Mukherjee

Department of Materials Science and Engineering
Michigan Technological University

Abstract: This talk presents an overview of state-of-the-art capabilities of the aberration-corrected scanning transmission electron microscope (ac-STEM) at ACMAL, Michigan Tech. The FEI Titan Themis microscope we have here is one of a kind in the whole nation in terms of capabilities.

 Tuesday, October 22 at 11:00 am to 12:00 pm

 Minerals and Materials Engineering Building (M&M), 610
1400 Townsend Drive, Houghton, MI 49931

Titan S-TEM at 80kV

Some users require an 80kV beam voltage for biological samples. It isn’t possible to switch back and forth. Going from 80kv back to 200kV requires a period to stabilize again (overnight). Therefore, we are trying to schedule the 80kV experiments to Thursday and Friday each week.

Let me know if you don’t think this will work for you.

Logbook System Changes

IT has rewritten the logbook system software. There are some great new features that we will appreciate. It isn’t ready for installation – on some systems we are going to have to upgrade the thin clients (little computer boxes) to use a newer web browser. We’ll do initial testing on the FIB since it gets less use. These instruments will be upgraded

FESEM
SEM
TEM
FIB
ESEM
Confocal (has newer client – may not need upgrading)
STEM (has newer client – may not need upgrading)

I’ll let you now when we are testing on the FIB.