Author: Sue Hill

Who is Imaging Hemolysin X Treated Red Blood Cells at Michigan Tech?

The Laboratory of Mechanistic Glycobiology research group, led by Dr. Tarun Dam, is studying how the function of biomolecules from plant cells translates to human cells. Hemolysin X is a biomolecule that can disrupt and disintegrate cell membranes. The image above depicts how Hemolysin X systematically disintegrates a red blood cell.  The research group is looking into how this molecule reacts with other types of mammalian cells, including cancer cells.

Image taken by Jared Edwards, Chemistry PhD candidate, on ACMAL’s Hitachi S-4700 FE-SEM.

Learn more about the Laboratory of Mechanistic Glycobiology research group: Laboratory of Mechanistic Glycobiology

Visit the Applied Chemical and Morphological Analysis Laboratory’s webpage to learn more about our shared facility and instruments available to the Michigan Tech research community: ACMAL


Who is Imaging Electrospun Polycaprolactone Fiber Scaffolding at Michigan Tech?

Dr. Smitha Rao, assistant professor for Biomedical Engineering at Michigan Tech, and the Biomedical µDevices research team developed a way to be able to observe how breast cancer cells grow and migrate in various environments. The project developed scaffolding systems that mimic structures that could be found in human tissue. They engineered three polycaprolactone scaffold structures to test different topographical and mechanical features: hexagonal, mesh-like and aligned.

The image was taken by Dr. Smitha Rao’s graduate and undergraduate students using ACMAL’s Hitachi S-4700 FE-SEM.

Read more about Dr. Rao and the Biomedical µDevices research team’s work:

Visit the Applied Chemical and Morphological Analysis Laboratory’s webpage to learn more about our shared facility and instruments available to the Michigan Tech research community: ACMAL

If you have you have an image you would like to be featured, submit it here:

ACMAL Blog Submission


New Remote Teaching and Research Capabilities

Over the past year, several ACMAL labs have been equipped with new software and cameras for improved remote teaching and research! These new remote capabilities allow for live/recorded demonstrations to be shared with large classes or for research clients and to view live data collection.

Below are descriptions of these instruments and laboratories affected:

FEI 200kV Titan Themis Scanning Transmission Electron Microscope (STEM)

The STEM is Michigan Tech’s newest electron microscope addition that has atomic resolution imaging capabilities. The instrument has the following capabilities and modes: conventional TEM mode, scanning TEM mode, electron energy loss spectroscopy, energy filter TEM, high angle annular dark field, ChemiSTEM, Super-X Energy Dispersive X-Ray, and nanometer scale tomography. 

New remote capabilities include:

  • Zoom screen-share from both the TEM laboratory web camera and instrument control monitors
  • Huskycast (Panopto) recording of lab space, TEM lab camera, and instrument control monitors

Learn more about the STEM: ACMAL – FEI 200kV Titan Themis STEM

Contact Elizabeth Miller (eafraki@mtu.edu) for more information.

FEI Philips XL 40 Environmental Scanning Microscope (ESEM)

The ESEM can be used to image a wide range of material types at a microscale including hydrated, contaminated, organic, or inorganic samples. This microscope itself has several modes and features that make it a flexible instrument for any research needs: SE/BSE imaging, thin window EDAX EDS, electron backscatter diffraction, high and low vacuum modes, and hot or cold stage options.

New remote capabilities include:

  • New laboratory web camera
  • Zoom screen-share abilities from both the microscope control and AzTEC analysis computers
  • Remote technical assistance with Raritan DKX4-101 KVM-over-IP
  • Remote operation with Raritan DKX4-101 KVM-over-IP

Learn more about the ESEM: ACMAL – FEI Philips XL 40 ESEM

Contact Elizabeth Miller (eafraki@mtu.edu) for more information.

X-Ray Facilities: Scintag XDS2000 Powder Diffractometer and Scintag XDS-2000 PTS

ACMAL’s X-ray facilities (XRF) has instruments capable of performing x-ray diffraction (XRD) analyses on both powder and solid samples. Sample data such as present phases, lattice parameter, percent crystallinity, and texture analysis can all be found using MTU’s Scintag XDS2000 Powder Diffractometer and Scintag XDS-2000 PTS XRD instruments. These instruments have the following features to expand the types of samples that can be analyzed: zero background sample holder, custom powder sample holders, custom irregular shaped solid holder, custom liquid holder, ICDD-JCPDS database, and Anton-Paar high temperature stage.

New remote capabilities include:

  • New cameras installed in both the instrument lab and sample preparation lab.
  • Huskycast (Panopto) recording for both cameras and lab computer monitors.
  • Zoom sharing available in both labs and computer monitors.

Learn more about X-ray facilities: ACMAL – X-Ray Facilities

Contact Dr. Edward Laitila (ealaitil@mtu.edu) for more information.


Postdoctoral Scientist: STEM Specialist

Michigan Tech and the Materials Science and Engineering (MSE) department seek a postdoctoral scientist to serve as a specialist in the operation and application of an FEI Titan Themis Scanning Transmission Electron Microscope (STEM) and its associated attachments for interdisciplinary users across campus as well as potential users external to campus.

Learn More and Apply


Recent Advances in ACMAL STEM Facility on January 22

Pinaki Mukherjee
Pinaki Mukherjee

Join us for the first seminar of the Spring Semester at 1 p.m. Friday (Jan. 22) via Zoom (passcode 645507).

Pinaki Mukherjee (MSW) will present ” Recent Advances in ACMAL STEM Facility.” This talk presents an overview of state-of-the-art capabilities of the aberration-corrected scanning transmission electron microscope (ac-STEM) at ACMAL, Michigan Tech.

Mukherjee joined Michigan Tech in January of 2018. He obtained his PhD in Materials Engineering from the University of Nebraska-Lincoln. He worked as a post-doctorate researcher at Rutgers University, The State University of New Jersey. He was an affiliate of the National Center for Electron Microscopy, at Lawrence Berkley National Laboratory.


Job Opening for Director of ACMAL

Director Applied Chemical and Morphological Analysis Laboratory

Position is Closed

Apply now

Job No: 20043
Department: Materials Science and Engineering
Work Type: Staff Full-time
Location: Main Campus (Houghton, MI)
Full Time / Part Time: Full Time
Categories: Management, Sciences

Michigan Tech seeks a director of its Applied Chemical and Morphological Analysis Laboratory (ACMAL). ACMAL is an interdisciplinary, university shared user facility that manages a suite of high-end structural characterization facilities including SEM (3 units), STEM (FEI Titan Themis), FIB, XPS, AFM, XRD, XRF, and associated sample preparation facilities. The director manages the access and operational procedures, coordinates maintenance, oversees the personnel needs of the facility, interfaces with the campus-wide user community, coordinates user training, and leads or participates in efforts to expand capabilities and use. The Director will have a staff appointment in the Materials Science and Engineering Department, who manages the facility in behalf of the university.

The ideal candidate will have extensive experience in the operation of electron-based imaging and analytical techniques in a research environment, be familiar with shared user-oriented facility model, demonstrated managerial skills, and a positive attitude compatible with providing efficient and high quality service to the university research community. A degree in the physical sciences, or engineering, or applied technology discipline is preferred.

Michigan Technological University is an Equal Opportunity Educational Institution/Equal Opportunity Employer that provides equal opportunity for all, including protected veterans and individuals with disabilities.

View the Job Description


Spontaneous Selective Deposition of Iron Oxide Nanoparticles on Graphite as Model Catalysts

Chathura de Alwis (Chemistry), Timothy R. Leftwich (MSE), Pinaki Mukherjee (MSE), Alex Denofrea (Chemistry) and Kathryn A. Perrine (Chemistry) published a paper titled “Spontaneous selective deposition of iron oxide nanoparticles on graphite as model catalysts” in Nanoscale Advances in 2019.

DOI: 10.1039/c9na00472f

Extract

Iron oxide nanomaterials participate in redox processes that give them ideal properties for their use as earth-abundant catalysts. Fabricating nanocatalysts for such applications requires detailed knowledge of the deposition and growth. We report the spontaneous deposition of iron oxide nanoparticles on HOPG in defect areas and on step edges from a metal precursor solution.

Various defects were created on the highly oriented pyrolytic graphite (HOPG) surface using either argon (Ar+) sputtering or a focused ion beam (FIB) to provide defects for nucleation sites. A Hitachi 2000 A FIB instrument was used to create tailored arrays of defects on HOPG using a Ga+ beam.

The sputter rate was calculated using the amount of materials removed, by recording a height profile of 1 nm using atomic force microscopy (AFM) and the time to sputter the pattern.

All the samples were imaged using a Hitachi S-4700 cold field emission high resolution field emission scanning electron microscopy (FE-SEM) instrument.

X-ray photoelectron spectroscopy (XPS) was performed using a PHI 5800 to analyze the elemental composition and oxidation state of surface species of the iron oxide nanoparticles grown on the HOPG surface.

Scanning transmission electron microscopy (STEM) imaging and energy dispersive X-ray spectroscopy (EDS) mapping were used to measure the phase and composition of iron oxide nanoparticles after annealing and to confirm if the deposition was preferential at the defect sites of graphite. A FEI Titan Themis aberration corrected scanning transmission electron microscope was used to obtain atomically resolved electron images and EDS maps of the iron oxide nanoparticles on the graphene coated TEM grid. The microscope was operated at 200 kV using a point resolution of the aberration corrected STEM mode of 0.08 nm. The microscope was equipped with a SuperX™ X-ray detector, which is composed of 4 detectors for fast X-ray mapping in STEM mode. The EDS mapping of the sample was performed on specific particles with an average beam current of 100 pA.

Acknowledgements

Equipment for obtaining the AFM images in this project was provided by NSF CHE #1725818. The electron microscopy research was performed at the Applied Chemical and Morphological Analysis Laboratory, at Michigan Technological University. The electron microscopy facility is supported by NSF MRI 1429232. We acknowledge the Michigan Tech REF-RS fund for support of this work and the David J. and Valeria Pruett Graduate Research Fellowship. We acknowledge the Applied Chemical and Morphological Analysis Laboratory (ACMAL) for staff assistance and use of facilities.

Recommended Citation

de Alwis, C., Leftwich, T., Mukherjee, P., Denofre, A., & Perrine, K. (2019). Spontaneous selective deposition of iron oxide nanoparticles on graphite as model catalysts. Nanoscale Advances, 1(12), 4729-4744.

http://doi.org/10.1039/C9NA00472F

Retrieved from: https://digitalcommons.mtu.edu/michigantech-p/1246


Liz Miller’s schedule

Liz Miller will be out of town for 6 weeks beginning next week. Aleister and I will try to pick up the work she was doing during her absence. One area that he and I cannot assume is EBSD. We have asked someone to help us with that but the response will be slowed. So, plan your EBSD work ahead of time – don’t wait until the last minute or your work will be delayed.

Liz will return to work on April 6th.


Analytical Electron Microscopy at Nanoscale Feb. 13

Pinaki Mukherjee
Pinaki Mukherjee

ME-EM Graduate Seminar Speaker Series

proudly presents:

Pinaki Mukherjee, PhD

Michigan Technological University

Abstract: This talk presents an overview of state-of-the-art capabilities of the aberration-corrected scanning transmission electron microscope (ac-STEM) at ACMAL, Michigan Tech. The FEI Titan Themis microscope we have here is one of a kind in the whole nation in terms of capabilities. These capabilities have been developed in last two years and most of them are already available for users. We have a wide range of imaging and spectroscopic techniques that enables a user to identify elements at atomic scale (~ 0.1 nm). READ MORE

Thursday, February 13 at 4:00 p.m.

Electrical Energy Resources Center (EERC), 103
1400 Townsend Drive, Houghton, MI 49931