Tescan FIB-SEM and STEM Lunch and Learn April 18

Instrumentation with bench and computers.

You’re invited to join us for a special Lunch and Learn event sponsored by Tescan.

Advancements in FIB-SEM and STEM Technologies with Tescan

Explore the latest developments in Focused Ion Beam Scanning Electron Microscopy (FIB-SEM) and Scanning Transmission Electron Microscopy (STEM) technologies. Learn about their application for multiscale and multimodal chemical imaging of materials, including batteries and semiconductors.

Topic: Advancements in FIB-SEM and STEM Technologies for high throughput, multimodal characterization of materials
Date and Time: Thursday, April 18th, 10:30 a.m.–12:30 p.m.
Location: M&M 610
Lunch Provided: Enjoy lunch while learning about cutting-edge microscopy technologies.

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Additionally, they will briefly introduce the Tescan Collaboration Network (TCN), offering opportunities for collaborative research and instrument sharing across universities.

We look forward to your participation in this informative session!