Day: April 10, 2024

Attn: Sputter Coater User

The target on the sputter coater has worn out. A new target has been ordered and is expected within 6-10 business days. The target has temporarily been changed to Iridium.

There are special directions for using the Ir target (see detailed instructions below).

Target density: 22.42
Current: 20mA
Coating thickness: 1-3nm

Your two other options are:

1) We have a Cr target. However, in the past that has resulted in charging.

2) As soon as next week, you can start to schedule time with our staff on the Apreo2. Uncoated samples can be imaged using variable pressure mode. VP mode utilizes a gas in the sample chamber as a charge dissipation and signal amplification method, allowing analysis of a sample without preparation in the form of a conductive coating.

Tescan FIB-SEM and STEM Lunch and Learn April 18

Instrumentation with bench and computers.

You’re invited to join us for a special Lunch and Learn event sponsored by Tescan.

Advancements in FIB-SEM and STEM Technologies with Tescan

Explore the latest developments in Focused Ion Beam Scanning Electron Microscopy (FIB-SEM) and Scanning Transmission Electron Microscopy (STEM) technologies. Learn about their application for multiscale and multimodal chemical imaging of materials, including batteries and semiconductors.

Topic: Advancements in FIB-SEM and STEM Technologies for high throughput, multimodal characterization of materials
Date and Time: Thursday, April 18th, 10:30 a.m.–12:30 p.m.
Location: M&M 610
Lunch Provided: Enjoy lunch while learning about cutting-edge microscopy technologies.

Register Now

Additionally, they will briefly introduce the Tescan Collaboration Network (TCN), offering opportunities for collaborative research and instrument sharing across universities.

We look forward to your participation in this informative session!