Michigan Tech and the Materials Science and Engineering (MSE) department seek a postdoctoral scientist to serve as a specialist in the operation and application of an FEI Titan Themis Scanning Transmission Electron Microscope (STEM) and its associated attachments for interdisciplinary users across campus as well as potential users external to campus.
STEM in Electron Optics
The STEM is back online. The FEI technician was able to come in yesterday and today to complete the alignments.
Dr. Anjana will be contacting anyone who had previously scheduled sessions.
The STEM is currently offline due to an alignment issue. We are working with the service technician from FEI to repair the issue. They will likely need to come for an onsite service visit, which will hopefully be next week.
Once the repairs are complete, Anjana will be contacting anyone who had previously scheduled sessions.
The chiller repairs are completed and the instrument is back online.
The S-TEM will be offline today while the service technician is working on the chiller. The repairs should be completed this afternoon and the instrument available Monday morning. Dr. Anjana will contact you if we need to reschedule your appointment
Join us for the first seminar of the Spring Semester at 1 p.m. Friday (Jan. 22) via Zoom (passcode 645507).
Pinaki Mukherjee (MSW) will present ” Recent Advances in ACMAL STEM Facility.” This talk presents an overview of state-of-the-art capabilities of the aberration-corrected scanning transmission electron microscope (ac-STEM) at ACMAL, Michigan Tech.
Mukherjee joined Michigan Tech in January of 2018. He obtained his PhD in Materials Engineering from the University of Nebraska-Lincoln. He worked as a post-doctorate researcher at Rutgers University, The State University of New Jersey. He was an affiliate of the National Center for Electron Microscopy, at Lawrence Berkley National Laboratory.
This is the software that Pinaki uses for some of his STEM data.
Extend your research from home
By popular demand, Gatan is extending the limited-time version of Gatan Microscopy Suite (GMS) 3.4.1 software to help the electron microscopy community continue with their research from home.
Similar to the EELS/EDS Quantification and EFTEM analysis plugins, the new version unlocks the DigitalMontage, HREM, and STEMx capabilities. This temporary version is available until June 1, 2020, at no additional cost. Please download the latest package to access these new features and for minor bug fixes.
If you have any questions or need more information, please don’t hesitate to reach out to us.
Best regards,
Gatan
As a result of Dr. Koubek’s email to campus regarding the Governor’s executive order, I am cancelling all use reservations in the calendar this afternoon. We will be ready to begin again after we return from the stay at home 3 weeks from now.
Pinaki is out with an illness likely the remainder of this week. He will be rescheduling appointments.
ME-EM Graduate Seminar Speaker Series
proudly presents:
Michigan Technological University
Abstract: This talk presents an overview of state-of-the-art capabilities of the aberration-corrected scanning transmission electron microscope (ac-STEM) at ACMAL, Michigan Tech. The FEI Titan Themis microscope we have here is one of a kind in the whole nation in terms of capabilities. These capabilities have been developed in last two years and most of them are already available for users. We have a wide range of imaging and spectroscopic techniques that enables a user to identify elements at atomic scale (~ 0.1 nm). READ MORE
Thursday, February 13 at 4:00 p.m.
Electrical Energy Resources Center (EERC), 103
1400 Townsend Drive, Houghton, MI 49931