Research by Stephen A. Hackney, Professor, Materials Science and Engineering, Michigan Technological University.
Imaging by Pinaki Mukherjee, Staff, Materials Science and Engineering, Engineer/Scientist, Applied Chemical and Morphological Analysis Laboratory (ACMAL).
Instrument: FEI 200kV Titan Themis S-TEM in ACMAL’s Electron Optics Facility.
Scale bar indicates 500 nm.
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