Applied Chemical and Morphological Analysis Laboratory Newsblog

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College of Engineering

ACMAL HOLIDAY HOURS

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ACMAL will be closed next week on Thursday, July 4th, in observance of the holiday.

Please note the following availability of our team members during that week:

  • I will be out of the office all week.
  • Erico is still on leave in Brazil.
  • Ed will be available Monday through Wednesday.
  • Izzy will be available Monday through Wednesday, and possibly Friday.
  • Tim will be available by appointment.
  • Cooper will be available on Monday and Tuesday.
  • Alyssa will be available on Monday.

Plan accordingly for any deadlines or projects that may be affected by the closure. If you have any urgent matters that require attention, please reach out to the respective available team members listed above.

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Keyence VHX & LHX Lunch and Learn March 20, 2024

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Detail from a Keyence microscope illustration.

I am pleased to extend an invitation to you for a Lunch and Learn session with Keyence on March 20th, from 10 a.m. to 12 p.m.

Keyence is a leading provider of digital microscopes, and this session will provide valuable insights into their cutting-edge technologies and products. It’s a fantastic opportunity to learn about the latest advancements in the field and discover how Keyence’s solutions can benefit your research.

The event will include presentations, demonstrations, and interactive discussions, followed by a complimentary lunch.

Date: March 20th
Time: 10 a.m. to 12 p.m.
Location: M&M 610

Please RSVP by March 15 using the RSVP FORM to confirm your attendance. Feel free to share this opportunity with any colleagues or members of your research group who may be interested. We look forward to having you join us for this informative session.

RSVP Form

Best,
Liz

Elizabeth Miller

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ESEM Upgrade to SEMTech 8000

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Instrument Offline from 8/1 to 8/18

SEMView8000 Operator Console

I am writing to inform you about an exciting upgrade to our Environmental Scanning Electron Microscope (ESEM) system. ACMAL has received funding to upgrade the ESEM with the SEMView8000. We would like to take this opportunity to thank the Vice President for Research Office, the Institute for Materials Processing, the Materials Science and Engineering Department, and the MSE Senior Design team for making this upgrade possible.

The instrument will be temporarily offline from August 1 to August 18 to facilitate the installation of the SEMTech 8000 upgrade. During the upgrade period, the ESEM system will be inaccessible, and no reservations or usage will be possible. We kindly request that you plan your projects accordingly and make alternative arrangements for your imaging and analysis requirements during this period.

To ensure a smooth transition and help you familiarize yourself with the upgraded system, we will be offering training sessions for all ESEM users. These training sessions are mandatory for anyone intending to use the SEMTech 8000. The sessions will be conducted starting from August 19, once the upgrade is complete.

To schedule your training session, please sign up for training. You will be directed to our self-scheduling calendar, where you can choose a time slot that suits you best. Appointments are available starting August 19. Due to limited availability, we recommend scheduling your session at your earliest convenience.

We understand that this temporary unavailability and the training requirement may cause some inconvenience, and we apologize for any disruption it may cause to your work. However, we believe that the benefits of the SEMTech 8000 upgrade and the subsequent training will be instrumental in advancing our research capabilities.

If you have any urgent projects or time-sensitive samples requiring ESEM imaging during the upgrade period, please let us know as soon as possible. We will do our best to accommodate your needs either before or after the downtime.

We appreciate your understanding and patience during this upgrade process. The improved capabilities of the SEMTech 8000, along with the training sessions, will undoubtedly enhance our research capabilities and contribute to the success of our projects.

If you have any questions or concerns regarding the ESEM upgrade, the training sessions, or their impact on your work, please don’t hesitate to reach out to me directly. I am here to address any inquiries or provide additional information.

Related

Upgrades for ACMAL’s Environmental Scanning Microscope

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Call for Content: ACMAL Micrograph

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Micrograph showing a sample structure and 30 micron scale.

We at ACMAL are excited to announce that we are in the process of updating our micrograph posters.

We would greatly appreciate your valuable contributions to make them even more captivating. Though the initial focus is on electron images, we are also open to including other types of images, such as EDS/EBSD maps, that demonstrate the diverse range of analytical techniques available in our lab.

If you have captured any remarkable micrographs that you believe would be suitable for inclusion on our posters, we kindly invite you to share them with us. Your contributions will not only showcase your expertise but also contribute to the overall excellence of our collection.

To streamline the submission process, we have created an online form where you can easily upload your micrographs.

Micrograph Submission Form

We are eager to feature a diverse range of micrographs, highlighting the advancements and discoveries within the field of electron optics. Your submissions will help us showcase the remarkable work being done by our community.

Thank you in advance for your participation and for sharing your impressive micrographs. If you have any questions or require further assistance, please do not hesitate to reach out.

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Upgrades for ACMAL’s Environmental Scanning Microscope

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ESEM column and sample chamber.

The FEI Philips XL 40 Environmental Scanning Microscope (ESEM) is a large chamber scanning electron microscope. It is operated by a Michigan Tech shared facility, the Applied Chemical and Morphological Analysis Laboratory (ACMAL). ACMAL was awarded a Shared Facility Grant from the Associate Vice President of Research Development to upgrade the ESEM electronics and software system. The upgrade is expected to offset future repair costs and minimize instrument downtime.

If you have not considered the ESEM for your research, this instrument is capable of operating in high vacuum mode for conventional scanning electron microscopy.

The ESEM supports large area montage imaging and elemental mapping (up to a few square centimeters), energy dispersive spectrometer (EDS)-based phase analysis, chemical contrast imaging and EDS-based particle analysis, as well as crystallographic phase mapping, texture analysis and grain size orientation distribution by electron backscatter diffraction.

Contact ACMAL Director Elizabeth Miller with questions. You may request instrument training, sample preparation or sample analysis services. Remote training and collaboration are available. Request a tour for yourself and your team. We can help you select an instrument and find expertise in developing process plans for your research.

Current users are reminded to cite ACMAL in all publications arising from research using these instruments. Help us to build a community of electron microscopists.

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Under the Titan Lens: Microscope Takes Research to Atomic-Level

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Play Under the Titan Lens: Microscope Takes Research to Atomic-Level video
Preview image for Under the Titan Lens: Microscope Takes Research to Atomic-Level video

Under the Titan Lens: Microscope Takes Research to Atomic-Level

Tiny things lead to big discoveries in the Electron Optics Facility that houses Titan, the ultra-sensitive microscope that analyzes materials at the atomic level. The Titan Themis Scanning Transmission Microscope, or S-TEM, has its own dedicated and stabilized space, complete with water-cooled temperature controls and back-up power. A powerful tool in an extensive array of electron microanalytical and X-ray instruments in Michigan Tech’s Applied Chemical and Morphological Analysis Laboratory (ACMAL), Titan is one of only two microscopes of its kind in the state of Michigan. In addition to high-resolution images, Titan can also perform fractional or chemical analysis. Its applications are useful in many research areas, including health, industrial, and technology. The electron optics facility is managed by Erico Freitas, a research scientist who runs the majority of samples but also trains students on how to use the equipment.

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Funding Announcement: Seedling Research

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Sample preparation on a benchtop.

Planting the Seeds of Research

Are you a:

  • Tenured, tenure-track, or research faculty?
  • Post-doctoral researcher?
  • Michigan Tech staff member?

Are you planning to seek funds for research elsewhere, but require start-up money to develop your proposal?

If so, you are eligible to apply for Seedling Research Funding opportunities of up to $1,000.

The Applied Chemical and Morphological Analysis Laboratory (ACMAL) at Michigan Tech has set aside $4,000 to fund pre-proposal research. These funds are designed to be granted to those who need to do preliminary investigations and data collection, which will then be used to develop a proposal for research funding from another source.

Learn More and Apply

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Teachers in Action—Dr. Edward Laitila

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Edward Laitila
Edward Laitila

On Teaching Critical Thinking

Dr. Edward Laitila is a kind and humble science teacher who cannot be appreciated enough for his dedication to the advancement of science and the education of students. Over the years he has developed methods of analysis and processes for material development that are unique, practical, and yield powerful results. His way of teaching takes extra time to convey not only knowledge, but to impart skills in critical thinking that are too-often absent from a regular education. For his astounding work over many years, it is a pleasure to state just how valuable an asset he has been to Michigan Tech, to students, and to the scientific community.

Professor Laitila teaches courses in crystallography, diffraction, and materials forensics within the Materials Science and Engineering department. His official titles and positions are Senior Research Engineer/Scientist II and Adjunct Assistant Professor. His main duties are to act as the manager and sole employee of the X-Ray Facility, which operates under the Applied Chemical and Morphological Analysis Laboratory (ACMAL). There, he manages, operates and repairs the various X-Ray Diffraction (XRD) and X-Ray Fluorescence (XRF) equipment.

Research in X-Ray Diffraction

Dr. Laitila started running the X-Ray Facility in 1983. At that time he had a two-year electrical engineering degree. He then obtained a bachelor’s degree and spent the next 20 years researching and working. Eventually he found extra time to write a report on his years of research and to finish his PhD. He has many undergrad and graduate students doing research for him. He also teaches classes and helps students with planning their own research experiments and writing research papers. He now has nearly 40 years of experience in XRD.

XRD is a process of metrology which characterizes a material by measuring the size of, and pattern to, its atomic structure. X-rays are waves, and crystalline materials are made up of periodic arrangements of atoms in a crystal lattice structure. Every crystalline material has a pattern that is unique, referred to as a diffraction fingerprint. XRD involves wave behavior similar to light diffraction, such as that seen in the double slit experiment. The x-ray waves travel through spacing and can constructively or destructively interfere with each other, which results in the unique pattern. This produces a pattern of peaks and dark sections which can be analyzed to determine the material structure and the distance between the atoms themselves. Through XRD researchers can obtain pinpoint accuracy of a material’s lattice structure, chemical composition, and phase composition.

Recent Breakthroughs

Dr. Laitila’s research interests are X-ray diffraction theory and its many applications, including mechanical alloying, intermetallic materials, physical metallurgy, nanoscale materials, materials characterization, additive manufacturing, and powder metallurgy. His latest published research was featured in the journal Powder Diffraction, Vol. 23, Issue 2 and was entitled “Employing X-ray scattering to characterize materials with grain sizes in the nano-regime.” In it he explained his creation of a new analytical technique for measuring the number of atoms in the grain boundaries of a nanoscale material. He was chosen for publishing after giving a talk at an annual X-Ray powder diffraction conference. On that work, he remarked, “Even though I did it on one material, I showed that this could be applied to anything.” From that research he is now working on a process which can make iron directly from iron ore without a need for using carbon. Such a process is exciting because it could revolutionize the steel industry in a way that is net positive for earth’s climate.

In recent research Dr. Laitila has come up with a process for making nano-composites. With his novel method it is simple to vary the amount of a second phase by varying the milling time. He has dubbed it Mechanonanosynthesis. He explained that it will be ideal in the creation of powders for additive manufacturing.

Ed Laitila stands near equipment while he is teaching.
Ed Laitila instructs near the powder diffractometer.

Pioneering the Work

Dr. Laitila went into detail about some interesting projects he has done over the years. He explained that in 1983 the diffractometers were all analog machines, and that only a couple of types had been automated. The lab worked with a teletype, which put little holes on tape that would collect the data. Researchers would then put those in a mainframe computer to do analysis. He was asked in ‘84 if he could interface the diffractometer with an early-model PC, which had an 8088 processor. He used Basic to code an MS-DOS program for the interface. He laughed as he recalled the story, saying, “I got it to work, and got it to collect data, and then we bought an automated system.”

The professor describes himself as a big proponent of critical thinking. He explained, “I honestly believe we have got a major problem in our education system, because we teach knowledge instead of teaching how to think. Teachers here have critical thinking skills but we don’t usually focus on that. When a student comes to me with a question I try to return with a question that forces them to think of a way to answer their own question. Usually they have the knowledge but they don’t know how to piece it together. I try to piece things together from different subjects and how those things combine in material science. I try to take every opportunity to teach.” He explained that his favorite part of teaching is “seeing the light go on when a student gets the subject.”

Outreach in Materials

In addition to all his other duties, Dr. Laitila spends extra time teaching teenagers about science. He has run a session, as part of the Women in Engineering and Engineering Scholars program, for many years. Each summer for more than 50 years, Michigan Tech Summer Youth Programs (SYP) has welcomed to campus more than 1,000 youth from grades 6–11, from across the country and around the world. SYP students come for week-long, hands-on, experiential learning in one or more of their 50+ week-long explorations in science, technology, engineering, and mathematics (STEM), humanities, and law. Dr. Ed is a favorite among many students, especially those in the SYP. Last year, when students were finishing SYP and were asked what program was their favorite, they chanted Ed’s name.

Be the Catalyst

Dr. Edward Laitila is a catalyst for the process of science. He is a man that makes the magic happen. He is a student favorite, an expert in XRD, and a valuable researcher. Anyone interested in doing work with Edward or using the equipment in his lab should contact him or get in touch with ACMAL Director Elizabeth Miller for more information. Remote teaching and research are available. If you are a student with a project that requires XRD or are interested in helping Dr. Laitila with his research, there may be opportunities available to you.

There is no better place to get involved in some exciting research!

By Joshua Jongema.

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New Environmental Scanning Electron Microscope Proposal

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Schematic of the microscope interior with specimen chamber, gun, pump, and gas valve marked.

Basic ESEM gas pressure stages, by Gerry Danilatos.

The Department of Defense (DoD) announces the Fiscal Year 2023 Defense University Research Instrumentation Program (DURIP). I’m excited to share that the 2023 DURIP selections have been announced and our proposal for a new Environmental Scanning Electron Microscope is recommended for award. All indications are that it will be funded. Congratulations to Dr. Bruce Lee (PI), Dr. Paul Sanders, Dr. Trisha Sain, Dr. Kazuya Tajiri, and Dr. Stephen Techtmann. Once funded, the new instrument will be housed in ACMAL and available for use by the MTU research community.

The timing is still TBD but since the project should be completed within a year we are starting the planning process to finalize the equipment purchase. However, there is still an opportunity to add capabilities to the instrument, especially if cost share can be contributed. Some possible additions include: a windowless EDS detector for light element (including Li) analysis, tensile stage, cryo stage, etc.

Below is a summary of the capabilities of the proposed new SEM.

Summary of the Capabilities and Functions of the Proposed FE-ESEM

Instrument

  • Environmental or Variable Pressure Scanning Electron Microscope

Electron Source

  • Field emission gun assembly with Schottky emitter source

Voltage

  • 20 V to 30,000 V

Resolution at 30 kV

  • High-vacuum Mode: 1.0 nm (SED) and 2.5 nm (BSED)
  • Low-vacuum Mode: 1.3 nm (SED) and 2.5 nm (BSED)
  • Environmental Mode: 1.3 nm (SED)

Magnification

  • 20x to 1,000,000x in a single quadrant

Ulti Max 170 EDS

  • Fast acquisition (quantitative > 400,000 cps and mapping > 1,000,000 cps)
  • Operate at low beam current, minimizing beam damage (3.5–5 kV)
  • High sensitivity for light element analysis

Symmetry S2 EBSD

  • High-speed analysis (indexing > 4,500 patterns per second)
  • High sensitivity >800 patterns per second/nA
  • Operates at low beam currents

Heating Stage

  • In-situ experimentation up to 1,100°C
  • Compatible with SE, BSED, EDS & EBSD detectors

Add Your Input

If you have any suggestions for capabilities or would like to discuss please contact Liz Miller by December 15th.

The Principal Investigator is Bruce Lee for research in additive manufacturing, materials development, and plastic waste recycling. The funding agency is the Office of Naval Research. DURIP is designed to improve the capabilities of accredited United States (U.S.) institutions of higher education to conduct research and to educate scientists and engineers in areas important to national defense, by providing funds for the acquisition of research equipment or instrumentation.

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Who is Studying the Failure Mechanisms of Electrical Wire Terminals at Michigan Tech?

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Micrograph of a wire on a substrate with a 500 micron scale marker.

An Advanced Metalworks Enterprise undergraduate student team, sponsored by Lear Corporation, is studying the performance of copper electrical wires in automobiles. Corrosion is the most common failure mechanism of wires used in crimp connectors; deformation in the wire terminal’s tin plating can cause additional contact issues within the connector. Electron microscopy aids in pinpointing the location of corrosion products on the wire and observing deformation in the tin plating. With this analysis, the team can now explore ways to improve the wire quality or crimping mechanism to minimize wire failures.

Image taken by Eli Harma and Reese Eichner, senior undergraduate materials science and engineering students, on Philips XL 40 ESEM.

Learn more about the Advanced Metalworks Enterprise at MTU: AME Website

Visit the Applied Chemical and Morphological Analysis Laboratory’s webpage to learn more about our shared facility and instruments available to the Michigan Tech research community: ACMAL

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