Category: Hitachi S-4700 FE-SEM

FE-SEM in Electron Optics

FESEM stage change

FESEM users: During the recent Hitachi service the engineer tightened up the stage.  There is more friction now when you push the holder onto the stage.  Just push past the friction until the holder stops.  You can clearly see that in the chamber camera.  Let me know if you want me to show you what to do.

Change to FESEM x-ray detector

A persistent complaint about the FESEM EDS system was that it was hard to get enough counts (deadtime) for optimal work. To address this we upgraded the detecting crystal in the EDS detector. Now the crystal is 30 mm2 – it was 10 mm2. Now, for the same beam current, there are additional counts (deadtime). You can get 25-30% deadtime at 20kV with the condenser lens set to 5.

I have the system calibrated and you are free to use the upgraded EDS system.

Let me know if you have questions.