Applied Chemical and Morphological Analysis Laboratory Newsblog

Attn: Sputter Coater User

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The target on the sputter coater has worn out. A new target has been ordered and is expected within 6-10 business days. The target has temporarily been changed to Iridium.

There are special directions for using the Ir target (see detailed instructions below).

Target density: 22.42
Current: 20mA
Coating thickness: 1-3nm

Your two other options are:

1) We have a Cr target. However, in the past that has resulted in charging.

2) As soon as next week, you can start to schedule time with our staff on the Apreo2. Uncoated samples can be imaged using variable pressure mode. VP mode utilizes a gas in the sample chamber as a charge dissipation and signal amplification method, allowing analysis of a sample without preparation in the form of a conductive coating.

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Tescan FIB-SEM and STEM Lunch and Learn April 18

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Instrumentation with bench and computers.

You’re invited to join us for a special Lunch and Learn event sponsored by Tescan.

Advancements in FIB-SEM and STEM Technologies with Tescan

Explore the latest developments in Focused Ion Beam Scanning Electron Microscopy (FIB-SEM) and Scanning Transmission Electron Microscopy (STEM) technologies. Learn about their application for multiscale and multimodal chemical imaging of materials, including batteries and semiconductors.

Topic: Advancements in FIB-SEM and STEM Technologies for high throughput, multimodal characterization of materials
Date and Time: Thursday, April 18th, 10:30 a.m.–12:30 p.m.
Location: M&M 610
Lunch Provided: Enjoy lunch while learning about cutting-edge microscopy technologies.

Register Now

Additionally, they will briefly introduce the Tescan Collaboration Network (TCN), offering opportunities for collaborative research and instrument sharing across universities.

We look forward to your participation in this informative session!

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ATTN – STEM users – TEM sample holder

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We recently have encountered issues with the TEM single tilt holder and want to draw your attention to the right way of handling it.

Now that we have several certified users, and the number of users are increasing, and taking into account those parts are very expensive and may take time to replace, we all need to refresh ourselves on how to use it.

Please take a few minutes of your time to watch this YouTube video I find useful.

TEM Sample Holder Loading for Talos TFS (FEI) F200X

Please ask me if you have any questions.

Erico Freitas

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Welcome Isabella Jaszczak – New Research Engineer at ACMAL

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Group of three people accepting an award from a presenter.
Isabella Wakeham Jaszczak, second from left, was among the recipients of a research project award from the ASM Foundation in 2022.

ACMAL is pleased to welcome Isabella Jaszczak as new Research Engineer to our team.

Isabella graduated with a master’s degree in Material Science and Engineering (MSE) from Michigan Tech in 2023. Her research utilized EBSD and STEM imaging to quantify microstructural changes in high-strength, low-alloy steels. Shortly after earning her graduate degree, she was hired as a research engineer for the MSE department, specifically working with the Institute of Materials Processing, the ARC Research Group, and ACMAL’s electron microscopy facility. She is here to help you with sample preparation, SEM analysis, STEM imaging, or instrument training.

Outside of work, Isabella is a HuskyFit instructor at the SDC and enjoys creating pottery as a member of the Copper Country Community Arts Center’s Clay Co-op. McClain State Park is her favorite place to be in the Copper Country

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ThermoFisher XPS Brunch and Learn April 25

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Operator sitting by a computer next to a scientific instrument.

ACMAL is please to extend an invitation to the MTU research community for a Brunch and Learn session with ThermoFisher on April 25, 2024, 9–11 a.m.

Learn how X-ray Photoelectron Spectroscopy (XPS) can be used to investigate cutting-edge materials via surface chemistry and the elemental as well as electronic state of atoms.

Why you should attend:

  • Expand your understanding of XPS for materials analysis.
  • Speak directly with experts about today’s instrumentation and how it can work for you.

Date: April 25
Time: 9–11 a.m.
Location: M&M 610

Register Now

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